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90% of the usage of device node's full_name is printing it out in a
kernel message. However, storing the full path for every node is
wasteful and redundant. With a custom format specifier, we can generate
the full path at run-time and eventually remove the full path from every
node.
For instance typical use is:
pr_info("Frobbing node %s\n", node->full_name);
Which can be written now as:
pr_info("Frobbing node %pOF\n", node);
'%pO' is the base specifier to represent kobjects with '%pOF'
representing struct device_node. Currently, struct device_node is the
only supported type of kobject.
More fine-grained control of formatting includes printing the name,
flags, path-spec name and others, explained in the documentation entry.
Originally written by Pantelis, but pretty much rewrote the core
function using existing string/number functions. The 2 passes were
unnecessary and have been removed. Also, updated the checkpatch.pl
check. The unittest code was written by Grant Likely.
Signed-off-by: Pantelis Antoniou <pantelis.antoniou@konsulko.com>
Acked-by: Joe Perches <joe@perches.com>
Signed-off-by: Rob Herring <robh@kernel.org>
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Existing overlay unit tests examine individual pieces of the overlay
code. The new tests target the entire process of applying an overlay.
Signed-off-by: Frank Rowand <frank.rowand@sony.com>
Signed-off-by: Rob Herring <robh@kernel.org>
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This patch just replace the string 'selftest' with 'unittest'
in OF unittest and data and binding file.
I have tested it successfully on ARM.
Signed-off-by: Wang Long <long.wanglong@huawei.com>
Signed-off-by: Rob Herring <robh@kernel.org>
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If CONFIG_OF_UNITTEST=y then a kernel image make will always cause .version to
be incremented, even if there are not source changes. This is caused by
a lack of dependency tracking and checking for
drivers/of/unittest-data/testcases.dtb.o.
Signed-off-by: Frank Rowand <frank.rowand@sonymobile.com>
Signed-off-by: Rob Herring <robh@kernel.org>
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Introduce I2C device tree overlay tests.
Tests insertion and removal of i2c adapters, i2c devices, and muxes.
Signed-off-by: Pantelis Antoniou <pantelis.antoniou@konsulko.com>
Signed-off-by: Rob Herring <robh@kernel.org>
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Introduce selftests for overlays using sub-devices present
in children nodes.
Signed-off-by: Pantelis Antoniou <pantelis.antoniou@konsulko.com>
Signed-off-by: Grant Likely <grant.likely@linaro.org>
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Add unittests for OF overlays.
It tests overlay device addition/removal and whether
the apply revert sequence is correct.
Changes since V1:
* Added local fixups entries.
Signed-off-by: Pantelis Antoniou <pantelis.antoniou@konsulko.com>
Signed-off-by: Grant Likely <grant.likely@linaro.org>
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The original resolver format is way too cryptic, switch
to using a tree based format that gets rid of repetitions,
is more compact and readable.
At the same time, update the selftests to using the new local fixups
format.
Signed-off-by: Pantelis Antoniou <pantelis.antoniou@konsulko.com>
[grant.likely: Squashed in testcase changes and merged similar functions]
Signed-off-by: Grant Likely <grant.likely@linaro.org>
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This is unit testing code. It should use that name because it makes more
sense than 'selftest'. Rename the files to match and rename the config
variable.
Signed-off-by: Grant Likely <grant.likely@linaro.org>
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